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    Test Development Services
    Test Development Services

    JCET provides customers with test development and test program migration services.  Our capabilities include:

    ? Design for Manufacturing (DFM) consultation
    ? Test program development, debug and validation
    ? Device characterization
    ? First silicon characterization (wafer test)
    ? Test program optimization including test time optimization
    ? Probe card design, fabrication and qualification (wafer test)
    ? Load board design, fabrication and qualification (final test)
    ? Design, fabrication and qualification of any other interfacing hardware (final test)
    ? Multi-site migration to higher parallel testing
    ? Test program migration to a different test platform

    Included with these services are any test program changes required to rapidly maximize and stabilize first pass yields for high volume production.

    Test Development Flow



    联系我们 |  客户查询 |  法律声明

    联系我们 客户查询 法律声明

    版权所有@江苏长电科技股份有限公司 保留一切权利 苏ICP备05082751号-132028102000607

    版权所有@江苏长电科技股份有限公司
    保留一切权利
    苏ICP备05082751号-1 32028102000607
    千亿体育|官方网
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